X-ray photoelectron diffraction investigation of the cleavage plane in IT-transition metal dichalcogenides

D. Stoltz, Sven Stoltz

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Sammanfattning

We present a detailed study of the three members of the 1 T-transition metal dichalcogenides: TiSe2, TaSe2 and TaS2 by means of the X-ray photoelectron diffraction combined with single-scattering simulations. Our simulations of different surface terminations and their comparison with the measured diffraction patterns allow to determine that the cleavage occurs within the van der Waals gap. Singlescattering calculations are shown to simulate very well the measured diffractograms on these compounds. (c) 2007 Elsevier B.V. All rights reserved.
Originalspråkengelska
Sidor (från-till)172-177
TidskriftPhysica B: Condensed Matter
Volym398
Utgåva1
DOI
StatusPublished - 2007

Ämnesklassifikation (UKÄ)

  • Naturvetenskap
  • Fysik

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